Title :
An ILP formulation for reliability-oriented high-level synthesis
Author :
Tosun, S. ; Ozturk, O. ; Mansouri, N. ; Arvas, E. ; Kandemir, M. ; Xie, Y. ; Hung, W.-L.
Author_Institution :
Syracuse Univ., NY, USA
Abstract :
Reliability decisions taken early in system design can bring significant benefits in terms of design quality. This paper presents a 0-1 integer linear programming (ILP) formulation for reliability-oriented high-level synthesis that addresses the soft error problem. The proposed approach tries to maximize reliability of the design while observing the bounds on area and performance, and makes use of our reliability characterization of hardware components such as adders and multipliers. We implemented the proposed approach, performed experiments with several example designs, and compared the results with those obtained by a prior proposal. Our results show that incorporating reliability as a first-class metric during high-level synthesis brings significant improvements on the overall design reliability.
Keywords :
VLSI; adders; high level synthesis; integer programming; integrated circuit design; integrated circuit reliability; linear programming; ILP formulation; VLSI; adders; design quality; integer linear programming; multipliers; reliability-oriented high-level synthesis; soft error problem; Adders; Circuit faults; Combinational circuits; Computer errors; Embedded system; Hardware; High level synthesis; Integer linear programming; Neutrons; Single event upset;
Conference_Titel :
Quality of Electronic Design, 2005. ISQED 2005. Sixth International Symposium on
Print_ISBN :
0-7695-2301-3
DOI :
10.1109/ISQED.2005.15