Title :
Session 13 charge-coupled devices and applications [breaker page]
Author_Institution :
IBM T.J. Watson Research Center, Yorktown Heights, NY, USA
Abstract :
Start of the above-titled section of the conference proceedings record.
Keywords :
Charge-coupled devices and applications;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1974 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1974.1155257
