DocumentCode
2856644
Title
Cascode MOS image sensors
Author
Melen, R.
Author_Institution
Stanford University, Stanford, CA, USA
Volume
XVII
fYear
1974
fDate
15-13 Feb. 1974
Firstpage
32
Lastpage
33
Abstract
An MOS photodiode readout structure, providing the basis for a self-scan image sensor with a spike noise level significantly less than conventional MOS transistor scan sensors, will be discussed.
Keywords
Aluminum; Capacitance; Electrodes; Image sensors; MOSFETs; Noise level; Optical arrays; Optical noise; Photodiodes; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference. Digest of Technical Papers. 1974 IEEE International
Conference_Location
Philadelphia, PA, USA
Type
conf
DOI
10.1109/ISSCC.1974.1155262
Filename
1155262
Link To Document