A built-in self-test scheme for differential ring oscillators

Author

Dermentzoglou, L. ; Tsiatouhas, Y. ; Arapoyanni, A.

Author_Institution

Dept. of Informatics & Telecoms, Athens Univ., Greece

fYear

2005

fDate

21-23 March 2005

Firstpage

448

Lastpage

452

Abstract

In this paper a new built-in self-test (BIST) scheme is proposed suitable for testing differential voltage controlled ring oscillators. The proposed testing-scheme is capable of detecting single realistic faults of the circuit under test. These faults can be either short or bridging faults between circuit nodes or open faults at the circuit branches. The test result is provided by a digital fail/pass indication signal. Exhaustive simulations have revealed the effectiveness of the proposed technique regarding its fault coverage.

Keywords

built-in self test; integrated circuit testing; mixed analogue-digital integrated circuits; voltage-controlled oscillators; BIST; bridging faults; built-in self-test scheme; circuit under test; differential ring oscillators; digital fail/pass indication signal; fault coverage; voltage controlled ring oscillators; Automatic testing; Built-in self-test; Circuit faults; Circuit simulation; Circuit testing; Electrical fault detection; Fault detection; Ring oscillators; Voltage control; Voltage-controlled oscillators;

fLanguage

English

Publisher

ieee

Conference_Titel

Quality of Electronic Design, 2005. ISQED 2005. Sixth International Symposium on

Print_ISBN

0-7695-2301-3

Type

conf

DOI

10.1109/ISQED.2005.2

Filename

1410623