DocumentCode
2857157
Title
Voltage scaling, wire sizing and repeater insertion design rules for wave-pipelined VLSI global interconnect circuits
Author
Deodhar, Vinita V. ; Davis, Jeffrey A.
Author_Institution
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fYear
2005
fDate
21-23 March 2005
Firstpage
592
Lastpage
597
Abstract
This paper illustrates a method to determine the optimal voltage, wire sizing and repeater insertion design rules for a global wire routing level that uses wave-pipelined interconnect circuits. In order to balance performance, power and area, a throughput-per-energy-area (TPEA) metric is introduced to guide the design of a global wire routing level to achieve maximum throughput (i.e. bit-rate) with optimal utilization of resources. A 180 nm technology case study for a memory bus channel that requires an aggregate throughput of 332.8 Gbit/s illustrates that the optimal TPEA combination of 1 V supply, 6 repeaters per centimeter, a metal thickness to width aspect ratio of 2.5 and metal pitch to width ratio of 3 gives 12 % reduction in dynamic power and over 60 % reduction in wire area as compared to a published interconnect circuit that uses low voltage differential signaling (LVDS).
Keywords
VLSI; integrated circuit design; integrated circuit interconnections; network routing; 1 V; 180 nm; 332.8 Gbit/s; TPEA metric; VLSI; global wire routing level; maximum throughput; memory bus channel; repeater insertion design rules; throughput-per-energy-area metric; voltage scaling; wave-pipelined interconnect circuits; wire sizing; Analytical models; Dynamic voltage scaling; Inductance; Integrated circuit interconnections; Performance loss; Power dissipation; Repeaters; Throughput; Very large scale integration; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality of Electronic Design, 2005. ISQED 2005. Sixth International Symposium on
Print_ISBN
0-7695-2301-3
Type
conf
DOI
10.1109/ISQED.2005.128
Filename
1410649
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