DocumentCode
2857200
Title
Improving yield of torus nocs through fault-diagnosis-and-repair of interconnect faults
Author
Concatto, Caroline ; Almeida, Pedro ; Kastensmidt, Fernanda ; Cota, Érika ; Lubaszewski, Marcelo ; Hervé, Marcos
Author_Institution
Inst. de Inf., Univ. Fed. do Rio Grande do Sul, Porto Alegre, Brazil
fYear
2009
fDate
24-26 June 2009
Firstpage
61
Lastpage
66
Abstract
We propose a fault tolerance method for torus NoCs capable of increase the yield with minimal performance overhead. The proposed approach consists in detecting and diagnosing interconnect faults using BIST structures and activating alternative paths for the faulty links. Experimental results show that alternative fault-free paths are found by the dynamic routing for 95% of the diagnosed faults (stuck-at and pairwise shorts within a single link or between any two links).
Keywords
built-in self test; fault diagnosis; fault tolerance; interconnections; network routing; network-on-chip; BIST structures; alternative fault-free paths; dynamic routing; fault tolerance method; interconnect fault repair; torus NoCs; Built-in self-test; Fault detection; Fault diagnosis; Fault tolerance; Network-on-a-chip; Routing; Switches; System-on-a-chip; Testing; Wires; Diagnosis; Fault Tolerance; Interconnect faults; NoC; adaptive routing;
fLanguage
English
Publisher
ieee
Conference_Titel
On-Line Testing Symposium, 2009. IOLTS 2009. 15th IEEE International
Conference_Location
Sesimbra, Lisbon
Print_ISBN
978-1-4244-4596-7
Electronic_ISBN
978-1-4244-4595-0
Type
conf
DOI
10.1109/IOLTS.2009.5195984
Filename
5195984
Link To Document