Evaluating Alpha-induced soft errors in embedded microprocessors

Author

Rech, P. ; Gerardin, S. ; Paccagnella, A. ; Bernardi, P. ; Grosso, M. ; Reorda, M. Sonza ; Appello, D.

Author_Institution

Dipt. di Ing. dell´´Inf., Univ. di Padova, Padova, Italy

fYear

2009

fDate

24-26 June 2009

Firstpage

69

Lastpage

74

Abstract

This paper presents the results of alpha single event upsets tests of an embedded 8051 microprocessor. Cross sections for the different memory resources (i.e., internal registers, code RAM, and user memory) are reported as well as the error rate for different codes implemented as test benchmarks. Test results are then discussed to find the contribution of each available resource to the overall device error rate.

Keywords

benchmark testing; codes; embedded systems; error analysis; microprocessor chips; system-on-chip; alpha single event upsets tests; alpha-induced soft errors; code RAM; codes; device error rate; embedded 8051 microprocessor; internal registers; memory resources; test benchmarks; user memory; Circuit testing; Electronic packaging thermal management; Error analysis; Microprocessors; Random access memory; Registers; Semiconductor device measurement; Single event upset; System testing; System-on-a-chip;

fLanguage

English

Publisher

ieee

Conference_Titel

On-Line Testing Symposium, 2009. IOLTS 2009. 15th IEEE International

Conference_Location

Sesimbra, Lisbon

Print_ISBN

978-1-4244-4596-7

Electronic_ISBN

978-1-4244-4595-0

Type

conf

DOI

10.1109/IOLTS.2009.5195985

Filename

5195985