• DocumentCode
    2857252
  • Title

    Online error detection and correction of erratic bits in register files

  • Author

    Vera, X. ; Abella, J. ; Carretero, J. ; Chaparro, P. ; González, A.

  • Author_Institution
    Intel Labs., Univ. Politec. de Catalunya, Barcelona, Spain
  • fYear
    2009
  • fDate
    24-26 June 2009
  • Firstpage
    81
  • Lastpage
    86
  • Abstract
    Aggressive voltage scaling needed for low power in each new process generation causes large deviations in the threshold voltage of minimally sized devices of the 6T SRAM cell. Gate oxide scaling can cause large transient gate leakage (a trap in the gate oxide), which is known as the erratic bits phenomena. Register file protection is necessary to prevent errors from quickly spreading to different parts of the system, which may cause applications to crash or silent data corruption. This paper proposes a simple and cost-effective mechanism that increases the resiliency of the register files to erratic bits. Our mechanism detects those registers that have erratic bits, recovers from the error and quarantines the faulty register. After the quarantine period, it is able to detect whether they are fully operational with low overhead.
  • Keywords
    CMOS integrated circuits; SRAM chips; error correction; error detection; reliability; 6T SRAM cell; aggressive voltage scaling; erratic bits; error correction; gate oxide scaling; online error detection; register files; silent data corruption; transient gate leakage; Batteries; Costs; Error correction; Error correction codes; Frequency; Power generation; Protection; Random access memory; Redundancy; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    On-Line Testing Symposium, 2009. IOLTS 2009. 15th IEEE International
  • Conference_Location
    Sesimbra, Lisbon
  • Print_ISBN
    978-1-4244-4596-7
  • Electronic_ISBN
    978-1-4244-4595-0
  • Type

    conf

  • DOI
    10.1109/IOLTS.2009.5195987
  • Filename
    5195987