DocumentCode :
2857329
Title :
Multiscale Simulations of High Performance Capacitors and Nanoelectronic Devices
Author :
Bernholc, J. ; Ranjan, Viresh ; Ribeiro, F. ; Lu, W. ; Yu, L. ; Nardelli, M. Buongiorno
Author_Institution :
North Carolina State Univ., Raleigh
fYear :
2007
fDate :
18-21 June 2007
Firstpage :
194
Lastpage :
199
Abstract :
Recent advances in theoretical methods combined with the advent of massively-parallel supercomputers allow one to reliably simulate the properties of complex materials and device structures from first principles. We describe applications in two general areas: (i) novel polymer composites for ultrahigh density capacitors, necessary for pulsed power applications, such as electric rail guns, power conditioning, and dense electronic circuitry, and (ii) ballistic electron transport in novel molecule-on-semiconductor structures exhibiting negative differential resistance. The phase diagram of P(VDF-CTFE), which has an usually high energy density, is determined as a function of the electric field. The calculations explain the origin of the observed ultra-high capacitance and suggest a systematic route, not limited to polymers, for obtaining nanostructured materials with high energy density. Turning to molecular electronics, we investigated porphyrins between Si leads, which are candidates for molecular memories and logic. We show that they exhibit tunable negative differential resistance (NDR). In some cases, huge peak-to-valley ratios are obtained, which should result in excellent switching behavior.
Keywords :
ballistic transport; capacitors; molecular electronics; nanotechnology; ballistic electron transport; dense electronic circuitry; electric rail guns; high performance capacitors; massively-parallel supercomputers; molecular electronics; molecule-on-semiconductor structures; nanoelectronic devices; nanostructured materials; negative differential resistance; peak-to-valley ratios; polymer composites; porphyrins; power conditioning; ultrahigh density capacitors; Capacitors; Circuit simulation; Electron guns; Materials reliability; Nanoscale devices; Polymers; Pulse circuits; Rails; Reliability theory; Supercomputers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
DoD High Performance Computing Modernization Program Users Group Conference, 2007
Conference_Location :
Pittsburgh, PA
Print_ISBN :
978-0-7695-3088-5
Type :
conf
DOI :
10.1109/HPCMP-UGC.2007.54
Filename :
4437984
Link To Document :
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