DocumentCode :
2857475
Title :
Power MOSFETs Paralleling Operation for High Power High Density Converters
Author :
Wang, Hongfang ; Wang, Fred
Author_Institution :
Bradley Dept. of Electr. & Comput. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA
Volume :
5
fYear :
2006
fDate :
8-12 Oct. 2006
Firstpage :
2284
Lastpage :
2289
Abstract :
In high power high density converters, the power MOSFETs can be used in parallel as the main switch to meet the current rating requirement, increase the switching frequency, and reduce the power loss. This paper investigates the possible benefits and problems associated with the power MOSFETs paralleling operation for higher power high frequency applications. The conduction state current sharing and power loss are investigated considering the device junction temperature effect and conduction resistance mismatch. The switching transient current sharing is analyzed including the device parameters tolerance, power stage parasitic inductance and gate driving ability. A dynamic current sharing approach from the gate side is proposed. The experimental results indicate that the power MOSFETs can be paralleled with the proper gate driving design even if the device parameters are mismatched, and as a result the switching losses are significantly reduced
Keywords :
high-voltage engineering; power MOSFET; power convertors; MOSFET parallel operation; conduction resistance mismatch; conduction state current sharing; device junction temperature effect; device parameter tolerance; dynamic current sharing approach; gate driving ability; high power high density converters; power MOSFET; power loss; power stage parasitic inductance; switching transient current sharing; Frequency conversion; MOSFETs; Resonance; Switches; Switching converters; Switching frequency; Switching loss; Temperature; Transient analysis; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industry Applications Conference, 2006. 41st IAS Annual Meeting. Conference Record of the 2006 IEEE
Conference_Location :
Tampa, FL
ISSN :
0197-2618
Print_ISBN :
1-4244-0364-2
Electronic_ISBN :
0197-2618
Type :
conf
DOI :
10.1109/IAS.2006.256860
Filename :
4025549
Link To Document :
بازگشت