• DocumentCode
    2857485
  • Title

    Oxide-isolated integrated injection logic

  • Author

    Allen, Ross ; Schuegraf, Klaus

  • Author_Institution
    Northrop Research and Technology Center, Hawthorne, CA, USA
  • Volume
    XVII
  • fYear
    1974
  • fDate
    15-13 Feb. 1974
  • Firstpage
    16
  • Lastpage
    17
  • Abstract
    Integrated injection logic circuits incorporating oxide isolation for optimum speed power performance will be discussed, citing test data from I2L/MSI chips with either N+ or oxide isolation structures. A comparison of functional density, power-product, maximum clock rate and process complexity will be presented.
  • Keywords
    Conductivity; Delay effects; Diodes; Geometry; Integrated circuit technology; Inverters; Logic devices; Parasitic capacitance; Power supplies; Pulse measurements;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference. Digest of Technical Papers. 1974 IEEE International
  • Conference_Location
    Philadelphia, PA, USA
  • Type

    conf

  • DOI
    10.1109/ISSCC.1974.1155316
  • Filename
    1155316
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2857485