• DocumentCode
    2857546
  • Title

    Diagnostic analysis of the charge transfer in CCDs

  • Author

    Wallinga, H. ; van Ruyven, H.

  • Author_Institution
    Twente University of Technology, Enschede, Netherlands
  • Volume
    XVII
  • fYear
    1974
  • fDate
    15-13 Feb. 1974
  • Firstpage
    148
  • Lastpage
    149
  • Abstract
    A small signal low-frequency measurement method to analyze the charge transfer mechanism in CCDs, occurring within time intervals between 1 ns and 1μs, using trapezoidal clock waveforms at frequencies below 1 MHz, will be covered.
  • Keywords
    Aluminum; Charge coupled devices; Charge transfer; Clocks; Electron devices; Equations; MOSFETs; Potential well; Predictive models; Signal processing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference. Digest of Technical Papers. 1974 IEEE International
  • Conference_Location
    Philadelphia, PA, USA
  • Type

    conf

  • DOI
    10.1109/ISSCC.1974.1155320
  • Filename
    1155320
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2857546