Title :
Diagnostic analysis of the charge transfer in CCDs
Author :
Wallinga, H. ; van Ruyven, H.
Author_Institution :
Twente University of Technology, Enschede, Netherlands
Abstract :
A small signal low-frequency measurement method to analyze the charge transfer mechanism in CCDs, occurring within time intervals between 1 ns and 1μs, using trapezoidal clock waveforms at frequencies below 1 MHz, will be covered.
Keywords :
Aluminum; Charge coupled devices; Charge transfer; Clocks; Electron devices; Equations; MOSFETs; Potential well; Predictive models; Signal processing;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1974 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1974.1155320
