DocumentCode
2857589
Title
Using test infrastructures for (remote) online evaluation of the sensitivity to SEUs of FPGAs
Author
Fidalgo, André V. ; Alves, Gustavo R. ; Felgueiras, Manuel C. ; Gericota, Manuel G.
Author_Institution
LABORIS, ISEP, Portugal
fYear
2009
fDate
24-26 June 2009
Firstpage
181
Lastpage
181
Abstract
This paper proposes an online mechanism that can evaluate the sensitivity of single event upsets (SEUs) of field programmable gate arrays (FPGAs). The online detection mechanism cyclically reads and compares the values form the external and internal configuration memories, taking into account the mask information. This remote detection method also signals any mismatch as a result of a SEU that affects both used and not-used FPGA parts, which maximizes the monitored area. By utilizing an external, Web-accessible controller that is connected to the test infrastructure, the possibility of running the same operation in a remote manner is enabled. Moreover, the need for a local memory to store the mask values is also eliminated.
Keywords
Internet; SRAM chips; field programmable gate arrays; SRAM-based FPGA; Web-accessible controller; external configuration memories; field programmable gate arrays; internal configuration memories; mask information; online detection; online evaluation; sensitivity evaluation; single event upsets; test infrastructures; Circuit faults; Degradation; Field programmable gate arrays; Flip-flops; Manufacturing; Routing; Single event transient; Single event upset; Table lookup; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
On-Line Testing Symposium, 2009. IOLTS 2009. 15th IEEE International
Conference_Location
Sesimbra, Lisbon
Print_ISBN
978-1-4244-4596-7
Electronic_ISBN
978-1-4244-4595-0
Type
conf
DOI
10.1109/IOLTS.2009.5196006
Filename
5196006
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