• DocumentCode
    2857589
  • Title

    Using test infrastructures for (remote) online evaluation of the sensitivity to SEUs of FPGAs

  • Author

    Fidalgo, André V. ; Alves, Gustavo R. ; Felgueiras, Manuel C. ; Gericota, Manuel G.

  • Author_Institution
    LABORIS, ISEP, Portugal
  • fYear
    2009
  • fDate
    24-26 June 2009
  • Firstpage
    181
  • Lastpage
    181
  • Abstract
    This paper proposes an online mechanism that can evaluate the sensitivity of single event upsets (SEUs) of field programmable gate arrays (FPGAs). The online detection mechanism cyclically reads and compares the values form the external and internal configuration memories, taking into account the mask information. This remote detection method also signals any mismatch as a result of a SEU that affects both used and not-used FPGA parts, which maximizes the monitored area. By utilizing an external, Web-accessible controller that is connected to the test infrastructure, the possibility of running the same operation in a remote manner is enabled. Moreover, the need for a local memory to store the mask values is also eliminated.
  • Keywords
    Internet; SRAM chips; field programmable gate arrays; SRAM-based FPGA; Web-accessible controller; external configuration memories; field programmable gate arrays; internal configuration memories; mask information; online detection; online evaluation; sensitivity evaluation; single event upsets; test infrastructures; Circuit faults; Degradation; Field programmable gate arrays; Flip-flops; Manufacturing; Routing; Single event transient; Single event upset; Table lookup; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    On-Line Testing Symposium, 2009. IOLTS 2009. 15th IEEE International
  • Conference_Location
    Sesimbra, Lisbon
  • Print_ISBN
    978-1-4244-4596-7
  • Electronic_ISBN
    978-1-4244-4595-0
  • Type

    conf

  • DOI
    10.1109/IOLTS.2009.5196006
  • Filename
    5196006