Multi-Frequency Microwave Response to Periodic Rougheness

A series of field experiments were conducted to verify the effects of roughness on passive microwave emission. From these field experiments, it was observed that surface roughness increases observed brightness temperatures (higher emissivity) at horizontal polarization while diminishing the vertically polarized brightness temperatures marginally. The advanced integral equation method (AIEM) and QP models were found to model the effects of surface roughness fairly reasonably. The QP model which is a parameterized version of the AIEM was found to show correspondence with the AIEM simulations and is therefore recommended for application in AMSR based data assimilation schemes.