Title :
Accelerated life testing leds on temperature and current
Author :
Nogueira, Eduardo ; Mateos, Juan
Author_Institution :
Dept. de Electron. Fis., Univ. Politec., Madrid, Spain
Abstract :
LED products intended for outdoor applications need specific tests to evaluate its reliability. In this paper tests for detecting failures at high temperatures and currents below maximum current rating conditions, have been carried out. Open circuit catastrophic failures have been observed in these tests at a constant current. Failure mechanisms have been analyzed. Temperature and current acceleration factors of this failure mechanism have been evaluated based on Arrhenius and Inverse Power Law Relationship.
Keywords :
failure analysis; life testing; light emitting diodes; Arrhenius-inverse power law model; LED; accelerated life testing; current acceleration factors; light-emitting diodes; open circuit catastrophic failures; temperatures acceleration factors; Degradation; Encapsulation; Light emitting diodes; Mathematical model; Reliability; Resistance; Temperature measurement; Accelerated Life Testing; Arrhenius-Inverse Power Law model; Light-emitting diodes; reliability;
Conference_Titel :
Electron Devices (CDE), 2011 Spanish Conference on
Conference_Location :
Palma de Mallorca
Print_ISBN :
978-1-4244-7863-7
DOI :
10.1109/SCED.2011.5744191
