Title :
A CCD nonlinear lumped model
Author :
Tanigawa, H. ; Ando, Takehiro
Author_Institution :
Nippon Electric Central Research Laboratories, Kawasaki, Japan
Abstract :
This paper will describe a proposed CCD model introducing a nonlinear drift concept which disclosed that the applied voltage waveform to the last transfer electrode had great influence on transfer efficiency. Operation modes and structure will be cited.
Keywords :
Charge coupled devices; Circuits; Current density; Difference equations; Differential equations; Electrodes; Laboratories; Nonlinear equations; Potential well; Voltage;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1974 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1974.1155328
