• DocumentCode
    2857752
  • Title

    Using Simulated Annealing Embedded Modified Gauss-Newton Algorithm to identify parameters of nonlinear degradation model

  • Author

    Jinyong, Yao ; Haibo, Su ; Xiaogang, Li

  • Author_Institution
    Dept. of reliability & Syst. Eng., Beijing Univ. of Aeronaut. & Astronaut., Beijing, China
  • Volume
    10
  • fYear
    2010
  • fDate
    22-24 Oct. 2010
  • Abstract
    High accuracy parameter identification is important to the life prediction by the degradation model. In this paper, the Simulated Annealing Embed Modified Gauss-Newton (SAEMGN) Algorithm is developed and has been applied in the degradation model parameters eliminating for Dielectric Resonator Oscillator (DRO). By comparing the local search and global search methods, we use the modified Gauss-Newton method as the local search embedded in the Simulated Annealing. Then, we established simulation model of a DRO in Step-Stress Accelerated Degradation Test to study the convergence properties of the algorithm. Numerical comparisons with MGN, SA, and Very Fast Simulated Annealing (VFSA) shows that the new algorithm could offer a higher accuracy solution with the error values is no more than 10-20. This algorithm will help to further improve the life prediction accuracy and credibility.
  • Keywords
    Gaussian processes; Newton method; dielectric resonator oscillators; search problems; simulated annealing; dielectric resonator oscillator; nonlinear degradation model; parameter identification; search methods; simulated annealing embedded modified Gauss-Newton algorithm; step stress accelerated degradation test; very fast simulated annealing; Annealing; Convergence; Gauss-Newton; Simulated Annealing; degradation; life prediction; nonlinear model;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Application and System Modeling (ICCASM), 2010 International Conference on
  • Conference_Location
    Taiyuan
  • Print_ISBN
    978-1-4244-7235-2
  • Electronic_ISBN
    978-1-4244-7237-6
  • Type

    conf

  • DOI
    10.1109/ICCASM.2010.5622225
  • Filename
    5622225