Title :
The root locus approach to the analysis of zero-location procedures
Author :
Lanzotti, Ernesto ; Lepschy, Antonio ; Viaro, Umberto
Author_Institution :
Dept. of Electron. & Inf., Padova Univ., Italy
Abstract :
The general two-term scattering-type recursive form of the usual s-domain stability-test procedures is considered. The Hurwitz property of the right-hand side is studied with reference to suitable root loci. Along these lines, three interesting particular cases and the related locus shapes are analyzed to motivate the structure of the left-hand side of the recurrence relation. The corresponding z-domain relations and the root locus associated with the two-term scattering-type form of the Bistritz algorithm are considered
Keywords :
frequency-domain analysis; polynomials; stability; Bistritz algorithm; Hurwitz property; locus shapes; recurrence relation; root locus approach; s-domain stability-test procedures; two-term scattering-type recursive form; z-domain relations; zero-location procedures; Algorithm design and analysis; Informatics; Interpolation; Least squares methods; Polynomials; Scattering; Shape; Signal analysis; Stability analysis; System testing;
Conference_Titel :
Circuits and Systems, 1992. ISCAS '92. Proceedings., 1992 IEEE International Symposium on
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-0593-0
DOI :
10.1109/ISCAS.1992.230534
