Title :
Invited: Physical limits in digital electronics
Author_Institution :
IBM T. J. Watson Research Center, Yorktown Heights, NY, USA
Abstract :
Miniaturization has been found to be the avenue to progress in digital electronics. Dielectric breakdown, thermal resistance and random fluctuations of impurity numbers can be identified as effects that will limit progress toward smaller dimensions.
Keywords :
Costs; Heat transfer; Impedance; Information processing; Logic circuits; Manufacturing; Power dissipation; Solid state circuits; Thermal resistance; Voltage;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1974 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1974.1155339
