Title :
Measurement of all the elastic and dielectric constants of poled PVDF films
Author :
Varadan, V.V. ; Roh, Y.R. ; Varadan, V.K. ; Tancrell, R.H.
Author_Institution :
Res. Center for the Eng. of Electron. & Acoust. Mater., Pennsylvania State Univ., University Park, PA, USA
Abstract :
As opposed to conventional piezoceramics, PVDF is a piezoelectric material, in polymer form. However, its properties are not well characterized due to the availability of poled PVDF only as a thin film. In the design of piezoelectric devices, properties such as all the components of the elastic stiffness tensor, dielectric tensor, and the electromechanical coupling tensor are needed. Poled PVDF is of mm2 symmetry. The frequency dependences of all nine complex elastic constants as well as the three complex dielectric constants were measured using a thin film and stacked, cubical samples of PVDF film. The elastic constants CD44 and C D55 as well as the dielectric constant εT11 and εT22 reported are new. Ultrasonic measurements and an impedance analyzer were used to obtain the measured data
Keywords :
elastic constants; permittivity; piezoelectric thin films; piezoelectricity; PVDF; complex dielectric constants; complex elastic constants; dielectric tensor; elastic stiffness tensor; electromechanical coupling tensor; piezoceramics; piezoelectric devices; piezoelectric material; polymer; Dielectric constant; Dielectric measurements; Dielectric thin films; Impedance measurement; Piezoelectric devices; Piezoelectric films; Piezoelectric materials; Polymer films; Tensile stress; Ultrasonic variables measurement;
Conference_Titel :
Ultrasonics Symposium, 1989. Proceedings., IEEE 1989
Conference_Location :
Montreal, Que.
DOI :
10.1109/ULTSYM.1989.67082