• DocumentCode
    2857861
  • Title

    Designing fault tolerant FSM by nano-PLA

  • Author

    Baranov, S. ; Levin, I. ; Keren, O. ; Karpovsky, M.

  • Author_Institution
    Sch. of Eng., Bar Ilan Univ., Ramat Gan, Israel
  • fYear
    2009
  • fDate
    24-26 June 2009
  • Firstpage
    229
  • Lastpage
    234
  • Abstract
    The paper deals with designing fault tolerant finite state machines (FSMs) by nanoelectronic programmable logic arrays (PLAs). Two main critical parameters of the fault tolerant nano-PLAs, the area and the number of crosspoint devices, are considered as optimization criteria for the synthesis. The paper introduces a method for synthesizing fault tolerant nano-PLA based FSMs. The method is based on decomposing an initial PLA description of the FSM into a three interacting portions. The proposed solution provides significant reduction of the area without meaningful increasing of a number of crosspoint devices in comparison with known solutions and provides a trade-off between the area and the number of devices in designing FSMs by PLAs.
  • Keywords
    fault tolerant computing; finite state machines; optimisation; programmable logic arrays; crosspoint devices; fault tolerant FSM; finite state machines; nanoelectronic programmable logic arrays; optimization; Circuit faults; Circuit synthesis; Design engineering; Fault tolerance; Fault tolerant systems; Logic design; Logic devices; Manufacturing; Nanoscale devices; Programmable logic arrays;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    On-Line Testing Symposium, 2009. IOLTS 2009. 15th IEEE International
  • Conference_Location
    Sesimbra, Lisbon
  • Print_ISBN
    978-1-4244-4596-7
  • Electronic_ISBN
    978-1-4244-4595-0
  • Type

    conf

  • DOI
    10.1109/IOLTS.2009.5196021
  • Filename
    5196021