DocumentCode
2857861
Title
Designing fault tolerant FSM by nano-PLA
Author
Baranov, S. ; Levin, I. ; Keren, O. ; Karpovsky, M.
Author_Institution
Sch. of Eng., Bar Ilan Univ., Ramat Gan, Israel
fYear
2009
fDate
24-26 June 2009
Firstpage
229
Lastpage
234
Abstract
The paper deals with designing fault tolerant finite state machines (FSMs) by nanoelectronic programmable logic arrays (PLAs). Two main critical parameters of the fault tolerant nano-PLAs, the area and the number of crosspoint devices, are considered as optimization criteria for the synthesis. The paper introduces a method for synthesizing fault tolerant nano-PLA based FSMs. The method is based on decomposing an initial PLA description of the FSM into a three interacting portions. The proposed solution provides significant reduction of the area without meaningful increasing of a number of crosspoint devices in comparison with known solutions and provides a trade-off between the area and the number of devices in designing FSMs by PLAs.
Keywords
fault tolerant computing; finite state machines; optimisation; programmable logic arrays; crosspoint devices; fault tolerant FSM; finite state machines; nanoelectronic programmable logic arrays; optimization; Circuit faults; Circuit synthesis; Design engineering; Fault tolerance; Fault tolerant systems; Logic design; Logic devices; Manufacturing; Nanoscale devices; Programmable logic arrays;
fLanguage
English
Publisher
ieee
Conference_Titel
On-Line Testing Symposium, 2009. IOLTS 2009. 15th IEEE International
Conference_Location
Sesimbra, Lisbon
Print_ISBN
978-1-4244-4596-7
Electronic_ISBN
978-1-4244-4595-0
Type
conf
DOI
10.1109/IOLTS.2009.5196021
Filename
5196021
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