Title :
Behavioral modeling and simulation of data converters
Author :
Liu, Edward ; Gielen, Georges ; Chang, Henry ; Sangiovanni-Vincentelli, Alberto L. ; Gray, Paul R.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Univ. of California, Berkeley, CA, USA
Abstract :
The authors present a behavioral representation for the class of Nyquist rate analog to digital (A/D) converters that captures the nominal behavior, as well as all the statistical variations. To describe behavioral effects due to process variations a covariance matrix, Σt is used. Applications of the model include identification of important A/D error sources, efficient computation of the distributions of integral nonlinearity and differential nonlinearity, signal-to-noise plus distortion ratio and efficient worst case and Monte Carlo system simulations. Parameter extraction results are presented that agree well with actual measurements
Keywords :
Monte Carlo methods; analogue-digital conversion; circuit analysis computing; noise; A/D error sources; Monte Carlo system simulations; Nyquist rate A/D converters; behavioral representation; covariance matrix; data converters; differential nonlinearity; integral nonlinearity; nominal behavior; parameter extraction; signal-to-noise plus distortion ratio; simulation; statistical variations; worst case simulation; Circuit noise; Circuit simulation; Computational modeling; Distortion; Distributed computing; Integrated circuit yield; Monte Carlo methods; Predictive models; SPICE; System performance;
Conference_Titel :
Circuits and Systems, 1992. ISCAS '92. Proceedings., 1992 IEEE International Symposium on
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-0593-0
DOI :
10.1109/ISCAS.1992.230568
