• DocumentCode
    2858073
  • Title

    Simplified peripheral circuits for a marginally testable 4K RAM

  • Author

    Foss, Richard ; Harland, Robert

  • Author_Institution
    Microsystems International, Ltd., Ottawa, Canada
  • Volume
    XVIII
  • fYear
    1975
  • fDate
    27426
  • Firstpage
    102
  • Lastpage
    103
  • Abstract
    The peripheral circuits of a 4K RAM, simplified to allow a chip size of 122 × 165 mils, with a 5-mask process, will be described. Testing affords measurement of the internal safe operating margins, where the signal levels are 106electrons or 160 mV.
  • Keywords
    Capacitance; Circuit testing; Clocks; Energy consumption; Flip-flops; Protection; Random access memory; Read-write memory; Silicon; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference. Digest of Technical Papers. 1975 IEEE International
  • Type

    conf

  • DOI
    10.1109/ISSCC.1975.1155354
  • Filename
    1155354
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2858073