Investigation of the Near Field Coupling Effects on Common-Mode EMI in Power Converter

Author

Chen, Wei ; Feng, Limin ; Chen, Henglin ; Qian, Zhaoming

Author_Institution

Coll. of Electr. Eng., Zhejiang Univ., Hangzhou

Volume

5

fYear

2006

fDate

8-12 Oct. 2006

Firstpage

2587

Lastpage

2592

Abstract

In this paper, the effects of near field couplings on common mode noise that exist in boost PFC converter are modeled and analyzed. It is obvious that these couplings have some effects on CM noise. For electric coupling, effects of parasitic capacitances between PCB traces and heat sink on CM noise is limited since these capacitances is so small compared with the parasitic capacitance between switching device and heat sink. For magnetic couplings, the mutual inductance between Boost inductor and CM noise current loop has no effect on CM noise, and mutual inductance between DM noise loop and CM noise loop will influence the resonant frequency

Keywords

electromagnetic interference; heat sinks; inductors; power convertors; power factor correction; printed circuits; CM noise current loop; CM noise loop; DM noise loop; PCB; boost PFC converter; boost inductor; common mode noise; common-mode EMI; electric coupling; heat sink; magnetic couplings; mutual inductance; near field coupling effects investigation; parasitic capacitances effects; power converter; resonant frequency; switching device; Electromagnetic interference; Heat sinks; Inductance; Inductors; Magnetic analysis; Magnetic noise; Magnetic resonance; Mutual coupling; Parasitic capacitance; Resistance heating;

fLanguage

English

Publisher

ieee

Conference_Titel

Industry Applications Conference, 2006. 41st IAS Annual Meeting. Conference Record of the 2006 IEEE

Conference_Location

Tampa, FL

ISSN

0197-2618

Print_ISBN

1-4244-0364-2

Electronic_ISBN

0197-2618

Type

conf

DOI

10.1109/IAS.2006.256903

Filename

4025592