DocumentCode :
2858197
Title :
Evaluation of diffusion patterning as an alternative substrate technology for automotive applications
Author :
Xue, Jie ; Baker, Theresa ; Klosowiak, Tom ; Molnar, Maria ; Pomery, M. ; Weimer, Jim ; Bianco, Gerry ; Mason, Robert
Author_Institution :
Motorola Inc., Northbrook, IL, USA
fYear :
1998
fDate :
15-17 Apr 1998
Firstpage :
454
Lastpage :
459
Abstract :
In automotive applications, electronic circuits are becoming move sophisticated in terms of functionality, power, and density. Specifically, the engine control unit (ECU) is being moved to direct engine mounting, minimizing interconnection length, reducing interference, and simplifying assembly and testing. This type of mounting will reduce the overall manufacturing cost. The electronics must therefore survive higher working temperatures, vibration and wider temperature excursions during on/off and temperature cycles. These requirements have been the driving force for robust multilayer substrates. Diffusion patterningTM (DP), a multilayer dielectric technology developed by DuPont Electronics, is evaluated for next generation ECUs. This high density thick film technology achieves via formation through a complex chemical reaction using an imaging paste. Moreover, DP technology may incorporate buried resistors and capacitors. Using DP technology, engine controllers with both four-layer and six-layer structures have been built. The six-layer substrate contains several buried resistors and capacitors. This paper discusses the critical parameters in fabrication of these substrates. The processibility and capacitance variations with different process parameters and firing conditions are also presented. DP technology is compatible with surface mount and flip chip technology. Long term reliability testing of flip chips on DP substrates was performed. After 4000 cycles, reliability data were excellent; no failures were identified. Reliability test results are reviewed
Keywords :
assembling; automotive electronics; buried layers; capacitors; ceramics; controllers; dielectric thin films; environmental degradation; flip-chip devices; hybrid integrated circuits; integrated circuit packaging; integrated circuit reliability; integrated circuit testing; internal combustion engines; photolithography; resistors; surface mount technology; DP substrates; DP technology; assembly; automotive applications; buried capacitors; buried resistors; capacitance variations; complex chemical reaction; diffusion patterning; diffusion patterning substrate technology; direct engine mounting; electronic circuit density; electronic circuit functionality; electronic circuit power; electronic circuits; engine control unit; engine controllers; firing conditions; flip chip technology; flip chips; four-layer structures; high density thick film technology; imaging paste; interconnection length; interference reduction; manufacturing cost; multilayer dielectric technology; multilayer substrates; on/off cycles; process parameters; reliability testing; six-layer structures; surface mount technology; temperature cycles; temperature excursions; testing; via formation; vibration; working temperatures; Capacitors; Chemical technology; Dielectric substrates; Engines; Flip chip; Nonhomogeneous media; Resistors; Surface-mount technology; Temperature; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Multichip Modules and High Density Packaging, 1998. Proceedings. 1998 International Conference on
Conference_Location :
Denver, CO
Print_ISBN :
0-7803-4850-8
Type :
conf
DOI :
10.1109/ICMCM.1998.670823
Filename :
670823
Link To Document :
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