• DocumentCode
    2858247
  • Title

    Use of Disdrometer Data for X-Band Polarimetric Radar Simulation and Tropical Rain Characterization

  • Author

    Baquero, Margarita ; Cruz-Pol, Sandra ; Bringi, V.N. ; Chandrasekar, V.

  • Author_Institution
    Electr. & Comput. Eng., Puerto Univ., Mayaguez
  • fYear
    2006
  • fDate
    July 31 2006-Aug. 4 2006
  • Firstpage
    1906
  • Lastpage
    1909
  • Abstract
    Natural variations in raindrop size distribution (DSD) were studied for simulated X band radar response from October 2004 to July 2005 (normal no-storm conditions) and during September 15th to 16th, 2004 when the tropical storm Jeanne passed over the island of Puerto Rico. Three types of estimators of rain rates were examined: A classical estimator R(ZH) and two polarimetric radar estimators R(KDP) and R(ZH,ZDR) . According to simulation results, the normalized errors (NEs) with respect data disdrometer of R(ZH),R(KDP) and R(ZHZDR) for all DSD samples in October 2004 to July 2005 data are 40.85%, 14.73%, and 15.83% respectively, while for the tropical storm Jeanne they are 23.39%, 9.35% and 14.53%. The results show that the estimator R(ZH) is the most sensitive to variations in DSD. Calibrated R-Z relations where developed for X-band for two conditions: storm/no-storm. Data from NASA TRMM satellite and rain gauges, the rain rate per hour was used for pinpointing areas of heaviest rain and for validation.
  • Keywords
    radar polarimetry; rain; remote sensing; storms; AD 2004 09 to AD 2005 07; NASA TRMM satellite data; Puerto Rico island; disdrometer data; polarimetric radar simulation; rain gauges data; raindrop size distribution; tropical rain characterization; tropical storm Jeanne; Attenuation; Computational modeling; Meteorological radar; Pollution measurement; Radar measurements; Radar polarimetry; Rain; Reflectivity; Spaceborne radar; Tropical cyclones;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium, 2006. IGARSS 2006. IEEE International Conference on
  • Conference_Location
    Denver, CO
  • Print_ISBN
    0-7803-9510-7
  • Type

    conf

  • DOI
    10.1109/IGARSS.2006.492
  • Filename
    4241639