• DocumentCode
    2858397
  • Title

    OPTTR induced current oscillations in GaN diodes Monte Carlo simulations

  • Author

    Íniguez-de-la-Torre, A. ; Mateos, J. ; González, T.

  • Author_Institution
    Dept. de Fis. Aplic., Univ. de Salamanca, Salamanca, Spain
  • fYear
    2011
  • fDate
    8-11 Feb. 2011
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    At very low temperature, when optical phonon emission is the dominant scattering mechanism, the phenomenon known as Optical Phonon Transit Time Resonance (OPTTR) may originate current oscillations in n+ nn+ diodes at frequencies in the terahertz range. In this work, by means of Monte Carlo simulations, we study the optimum conditions for the onset of such mechanism in GaN diodes. For this purpose, we analyze the influence of the following quantities: applied bias, temperature, length and doping of the n region. Under certain conditions, simulations show clear current oscillations which are enhanced when providing a characteristic frequency close to the plasma frequency of the active region. Even so, it is possible to achieve some degree of tunability of that oscillation frequency by varying the applied voltage and the length of the n region.
  • Keywords
    III-V semiconductors; Monte Carlo methods; gallium compounds; oscillations; phonons; semiconductor diodes; terahertz wave devices; wide band gap semiconductors; GaN; GaN diodes; Monte Carlo simulations; OPTTR induced current oscillations; characteristic frequency; current oscillations; dominant scattering mechanism; optical phonon emission; optical phonon transit time resonance; oscillation frequency; plasma frequency; Electron optics; Gallium nitride; Optical scattering; Oscillators; Phonons; Plasma temperature; Stimulated emission; Gallium nitride; Monte Carlo simulations; optical phonon emission; plasma frequency;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices (CDE), 2011 Spanish Conference on
  • Conference_Location
    Palma de Mallorca
  • Print_ISBN
    978-1-4244-7863-7
  • Type

    conf

  • DOI
    10.1109/SCED.2011.5744233
  • Filename
    5744233