Title :
The Study on LV Apparatus Testing Based on Infrared Image
Author :
Zhang, Jun ; Wang, Zhen-zhou ; Liu, Jiao-min ; Wang, Yan-Xia ; Wang, Jing
Author_Institution :
Inst. of Inf. Sci. & Eng., Hebei Univ. of Sci. & Technol., Shijiazhuang, China
Abstract :
Based on the principle of infrared radiation, the formulas of the real temperature calculation of a target surface under various conditions were derived. Thereby we obtain the real difference in temperature between two points, so that formulate expressions of the relative temperature difference. And introduce some application of infrared imaging technique in the test of the fault of low-voltage apparatus.
Keywords :
infrared imaging; low-power electronics; infrared image; infrared radiation; low-voltage apparatus testing; real temperature calculation; Area measurement; Atmospheric measurements; Electric variables measurement; Infrared detectors; Infrared imaging; Intelligent networks; Optical imaging; Radiation detectors; Temperature measurement; Testing; circuit breaker; diagnosis; infrared temperature measurement; relative temperature difference;
Conference_Titel :
Intelligent Networks and Intelligent Systems, 2009. ICINIS '09. Second International Conference on
Conference_Location :
Tianjin
Print_ISBN :
978-1-4244-5557-7
Electronic_ISBN :
978-0-7695-3852-5
DOI :
10.1109/ICINIS.2009.83
