DocumentCode
2858515
Title
The Study on LV Apparatus Testing Based on Infrared Image
Author
Zhang, Jun ; Wang, Zhen-zhou ; Liu, Jiao-min ; Wang, Yan-Xia ; Wang, Jing
Author_Institution
Inst. of Inf. Sci. & Eng., Hebei Univ. of Sci. & Technol., Shijiazhuang, China
fYear
2009
fDate
1-3 Nov. 2009
Firstpage
302
Lastpage
305
Abstract
Based on the principle of infrared radiation, the formulas of the real temperature calculation of a target surface under various conditions were derived. Thereby we obtain the real difference in temperature between two points, so that formulate expressions of the relative temperature difference. And introduce some application of infrared imaging technique in the test of the fault of low-voltage apparatus.
Keywords
infrared imaging; low-power electronics; infrared image; infrared radiation; low-voltage apparatus testing; real temperature calculation; Area measurement; Atmospheric measurements; Electric variables measurement; Infrared detectors; Infrared imaging; Intelligent networks; Optical imaging; Radiation detectors; Temperature measurement; Testing; circuit breaker; diagnosis; infrared temperature measurement; relative temperature difference;
fLanguage
English
Publisher
ieee
Conference_Titel
Intelligent Networks and Intelligent Systems, 2009. ICINIS '09. Second International Conference on
Conference_Location
Tianjin
Print_ISBN
978-1-4244-5557-7
Electronic_ISBN
978-0-7695-3852-5
Type
conf
DOI
10.1109/ICINIS.2009.83
Filename
5365868
Link To Document