DocumentCode :
2858622
Title :
High-sensitivity charge-transfer sense amplifier
Author :
Heller, Loree ; Spampinato, D. ; Ying Yao
Author_Institution :
IBM T. J. Watson Research Center, Yorktown Heights, NY, USA
Volume :
XVIII
fYear :
1975
fDate :
12-14 Feb. 1975
Firstpage :
112
Lastpage :
113
Abstract :
THE ONE-DEVICE dynamic memory cell, consisting of a single gating transistor and a storage capacitor, is attractive because of its low power consumption, its simple cell structure and its potential for high density. Density, however, is tied directly to the sensitivity of the detection circuit. It is the object of this paper to present a sense amplifier circuit with much better sensitivity than the standard latch circuit??, while maintaining the feature of conveniently restoring the information in the cell.
Keywords :
Capacitors; Delay; Energy consumption; Latches; Power supplies; Preamplifiers; Signal restoration; Solid state circuits; Threshold voltage; Turning;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1975 IEEE International
Conference_Location :
Philadelphia, PA, USA
Type :
conf
DOI :
10.1109/ISSCC.1975.1155390
Filename :
1155390
Link To Document :
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