DocumentCode
2858622
Title
High-sensitivity charge-transfer sense amplifier
Author
Heller, Loree ; Spampinato, D. ; Ying Yao
Author_Institution
IBM T. J. Watson Research Center, Yorktown Heights, NY, USA
Volume
XVIII
fYear
1975
fDate
12-14 Feb. 1975
Firstpage
112
Lastpage
113
Abstract
THE ONE-DEVICE dynamic memory cell, consisting of a single gating transistor and a storage capacitor, is attractive because of its low power consumption, its simple cell structure and its potential for high density. Density, however, is tied directly to the sensitivity of the detection circuit. It is the object of this paper to present a sense amplifier circuit with much better sensitivity than the standard latch circuit??, while maintaining the feature of conveniently restoring the information in the cell.
Keywords
Capacitors; Delay; Energy consumption; Latches; Power supplies; Preamplifiers; Signal restoration; Solid state circuits; Threshold voltage; Turning;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference. Digest of Technical Papers. 1975 IEEE International
Conference_Location
Philadelphia, PA, USA
Type
conf
DOI
10.1109/ISSCC.1975.1155390
Filename
1155390
Link To Document