DocumentCode :
2858679
Title :
COMPACT: a hybrid method for compressing test data
Author :
Ishida, Masahiro ; Ha, Dong Sam ; Yamaguchi, Takahiro
Author_Institution :
Advantest Lab. Ltd., Miyagi, Japan
fYear :
1998
fDate :
26-30 Apr 1998
Firstpage :
62
Lastpage :
69
Abstract :
The overall throughput of automatic test equipment (ATE) is sensitive to the download time of test data. An effective approach to the reduction of the download time is to compress test data before the download. The authors introduced a test data compression method which outperforms other methods for compressing test data. Our previous method was based on the Burrows-Wheeler transformation on the sequence of test patterns and run-length coding. In this paper, we present a new method, called COMPACT, which further improves our previous method. The key idea of COMPACT is to employ two data compression schemes, run-length coding for data with low activity and GZIP for data with high activity. COMPACT increases the compression ratio of test data, on average, by 1.9 times compared with our previous method
Keywords :
application specific integrated circuits; automatic testing; data compression; integrated circuit testing; runlength codes; Burrows-Wheeler transformation; COMPACT; GZIP; automatic test equipment; download time; hybrid method; overall throughput; run-length coding; test data compression; test patterns; Arithmetic; Automatic test equipment; Automatic testing; Data compression; Dictionaries; Laboratories; Test data compression; Test pattern generators; Throughput; Workstations;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 1998. Proceedings. 16th IEEE
Conference_Location :
Monterey, CA
ISSN :
1093-0167
Print_ISBN :
0-8186-8436-4
Type :
conf
DOI :
10.1109/VTEST.1998.670850
Filename :
670850
Link To Document :
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