• DocumentCode
    2858679
  • Title

    COMPACT: a hybrid method for compressing test data

  • Author

    Ishida, Masahiro ; Ha, Dong Sam ; Yamaguchi, Takahiro

  • Author_Institution
    Advantest Lab. Ltd., Miyagi, Japan
  • fYear
    1998
  • fDate
    26-30 Apr 1998
  • Firstpage
    62
  • Lastpage
    69
  • Abstract
    The overall throughput of automatic test equipment (ATE) is sensitive to the download time of test data. An effective approach to the reduction of the download time is to compress test data before the download. The authors introduced a test data compression method which outperforms other methods for compressing test data. Our previous method was based on the Burrows-Wheeler transformation on the sequence of test patterns and run-length coding. In this paper, we present a new method, called COMPACT, which further improves our previous method. The key idea of COMPACT is to employ two data compression schemes, run-length coding for data with low activity and GZIP for data with high activity. COMPACT increases the compression ratio of test data, on average, by 1.9 times compared with our previous method
  • Keywords
    application specific integrated circuits; automatic testing; data compression; integrated circuit testing; runlength codes; Burrows-Wheeler transformation; COMPACT; GZIP; automatic test equipment; download time; hybrid method; overall throughput; run-length coding; test data compression; test patterns; Arithmetic; Automatic test equipment; Automatic testing; Data compression; Dictionaries; Laboratories; Test data compression; Test pattern generators; Throughput; Workstations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 1998. Proceedings. 16th IEEE
  • Conference_Location
    Monterey, CA
  • ISSN
    1093-0167
  • Print_ISBN
    0-8186-8436-4
  • Type

    conf

  • DOI
    10.1109/VTEST.1998.670850
  • Filename
    670850