• DocumentCode
    2858771
  • Title

    Workshop preface

  • Author

    Pollefeys, Marc

  • fYear
    2005
  • fDate
    21-23 Sept. 2005
  • Abstract
    Welcome to the workshops of the IEEE Conference on Computer Vision and Pattern Recognition, held on June 20, 21 and 25, 2005, in San Diego, California. There are thirteen workshops spread over three days, with keynote speakers, talk, poster and demo sessions, panel discussions and even a grand challenge. On Monday, June 20, three workshops take place: the first IEEE Workshop on Computer Vision Applications for the Visually Impaired, the second IEEE Workshops on Object Tracking and Classification beyond the Visible Spectrum (OTCBVS??05) and the workshop for Empirical Evaluation Methods in Computer Vision (EEMVC??05). On Tuesday, June 21, five workshops are held: the IEEE Workshop on Learning in Computer Vision and Pattern Recognition, the IEEE International Workshop on Machine Vision for Intelligent Vehicles (MVIV??05), the IEEE Workshop on Face Recognition Grand Challenge Experiments, the IEEE Workshop on Vision for Human-Computer Interaction (V4HCI) and the IEEE Workshop on Performance of Outdoor Surveillance Systems and Equipment (POSSE). After the main conference on Saturday, June 25, five more workshops are being held: the third International Workshop on Attention and Performance in Computational Vision, the IEEE International Workshop on Projector-Camera Systems, the IEEE Workshop on Advanced 3D Imaging for Safety and Security (A3DISS 2005), the First IEEE Workshop on Embedded Computer Vision and the IEEE Workshop on Computer Vision Methods for Bioinformatics. All workshops except for the IEEE Workshop on Face Recognition Grand Challenge Experiments and the IEEE Workshop on Performance of Outdoor Surveillance Systems and Equipment (POSSE) have proceedings included on the conference DVD.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition - Workshops, 2005. CVPR Workshops. IEEE Computer Society Conference on
  • Conference_Location
    San Diego, CA, USA
  • ISSN
    1063-6919
  • Print_ISBN
    0-7695-2372-2
  • Type

    conf

  • DOI
    10.1109/CVPR.2005.558
  • Filename
    1565283