Title :
Automatic Inspection of Small Component on Loaded PCB Based on Mean-Shift and Support Vector Machine
Author :
Wang, Yan ; Sun, Yi ; Zhang, Wenxing
Author_Institution :
Sch. of Electron. & Inf. Eng., Dalian Univ. of Technol., Dalian, China
Abstract :
Automatic inspection of small components on loaded Printed Circuit Board (PCB) is difficult due to the requirements of precision and high speed. In this paper, a mean-shift and Support Vector Machine (SVM) based method for inspection of small components on loaded PCB is presented. Firstly, the images of small components are smoothened using mean-shift method and then their binary images are obtained by adaptive segmentation algorithm. Next, some features are extracted from the binary images and are input to a trained SVM to diagnose whether the small components are located correctly. The experimental results show that the proposed approach is effective and feasible to inspect small components on loaded PCB.
Keywords :
electronic engineering computing; image segmentation; inspection; printed circuits; support vector machines; adaptive segmentation; automatic inspection; binary images; loaded PCB; mean shift; printed circuit board; support vector machine; Feature extraction; Humans; Image segmentation; Inspection; Kernel; Manufacturing industries; Printed circuits; Sun; Support vector machine classification; Support vector machines; Mean-shift; automatic inspection; printed circuit board; support vector machine;
Conference_Titel :
Natural Computation, 2009. ICNC '09. Fifth International Conference on
Conference_Location :
Tianjin
Print_ISBN :
978-0-7695-3736-8
DOI :
10.1109/ICNC.2009.407