• DocumentCode
    2859136
  • Title

    LSI test strategies: Present and future

  • Author

    Finch, T.

  • Author_Institution
    Bell Labs., Murray Hill, NJ, USA
  • Volume
    XVIII
  • fYear
    1975
  • fDate
    27426
  • Firstpage
    159
  • Lastpage
    159
  • Abstract
    If you can´t measure it, you don´t know it. If you don´t know it, economic catastrophy usually strikes. Testability must be planned at the LSI concept, designed in, and with an implemented economical concern to insure an LSI payoff. These vital issues will be appraised.
  • Keywords
    Circuit testing; Costs; Large scale integration; Logic devices; Logic testing; Microprocessors; Pins; Sequential analysis; System testing; Test equipment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference. Digest of Technical Papers. 1975 IEEE International
  • Type

    conf

  • DOI
    10.1109/ISSCC.1975.1155424
  • Filename
    1155424
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2859136