• DocumentCode
    2859208
  • Title

    Influence of porosity on properties in fluorocarbon piezoelectrets

  • Author

    Lou, Ke-xing ; Zhang, Xiao-qing ; Cao, Gong-xun ; Sun, Zhuan-lan ; Xia, Zhong-fu

  • Author_Institution
    Dept. of Phys., Tongji Univ., Shanghai, China
  • fYear
    2010
  • fDate
    10-13 Dec. 2010
  • Firstpage
    89
  • Lastpage
    94
  • Abstract
    The fluorocarbon polymer films with regular void structure, made from fluoroethylenepropylene (FEP) and porous polytetrafluoroethylene (PTFE) layers were prepared by using the template patterning and fusion bonding process. After proper corona or contact charging, the films were piezoelectric. The microstructure, mechanical property, piezoelectricity and viscoelasticity of the fabricated films were studied by means of scanning electron microscope (SEM) technique, measurements of dielectric resonance spectra, and analysis of quasi-static d33 coefficient in time domain. The results show that, there ate threshold values of polarization about -4000 V, -3000 V and -2000 V in the films with porosities of 0,25% and 44%, respectively, and above the threshold voltage, the piezoelectric coefficient d33 of the films increases significantly with the enhancement of the polarization voltage. For the films with porosities of 0,25% and 44%, the measured dielectric anti-resonance frequencies are around 104 kHz, 119 kHz and 132 kHz, the calculated Young´s modulus are about 0.9 MPa, 0.58 MPa and 0.53 MPa and the densities of surface charge are 0.009 μC/cm2, 0.029 μC/cm2 and 0.046 μC/cm2, respectively. The piezoelectric response in time domain reflects the viscoelastic behaviors in the films. In addition, the films with large porosity show an improved piezoelectricity, which is perhaps due to the relative high density of charge and low Young´s modulus in them.
  • Keywords
    Young´s modulus; bonding processes; dielectric resonance; materials preparation; piezoelectric thin films; piezoelectricity; polymer films; polymer structure; porosity; scanning electron microscopy; surface charging; viscoelasticity; voids (solid); SEM; Young´s modulus; contact charging; corona charging; dielectric resonance spectra; fluorocarbon piezoelectret polymer films; fluoroethylenepropylene; fusion bonding process; mechanical property; microstructure; piezoelectric films; piezoelectricity; polarization; porosity; porous polytetrafluoroethylene layers; quasistatic piezoelectric d33 coefficient; scanning electron microscopy; surface charge; template patterning; viscoelasticity; void structure; Films; Piezoelectret; piezoelectricity; porosity; regular structure;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Piezoelectricity, Acoustic Waves and Device Applications (SPAWDA), 2010 Symposium on
  • Conference_Location
    Xiamen
  • Print_ISBN
    978-1-4244-9822-2
  • Type

    conf

  • DOI
    10.1109/SPAWDA.2010.5744281
  • Filename
    5744281