Title :
A lumped-modeling approach for TRAPATT diodes and external circuit analysis
Author :
Mitchell, Robert
Abstract :
A generalized lumped-modeling technique for TRAPATT diode analysis and diode-external circuit characterization will be described, detailing critical parameters affecting efficient TRAPPAT operation.
Keywords :
Aerospace electronics; Aircraft; Breakdown voltage; Circuit analysis; Circuit simulation; Electron traps; Plasma measurements; Semiconductor diodes; Silicon; Solid state circuits;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1975 IEEE International
DOI :
10.1109/ISSCC.1975.1155430
