DocumentCode :
2859274
Title :
The study of activation energy(Ea) by aging and high temperature storage for quartz resonator´s life evaluation
Author :
Chun-Nan Shen ; Xiao-wei Yang ; Chang, Carole ; Min-Chiang Chao
Author_Institution :
TXC (NINGBO) Corp., Ningbo, China
fYear :
2010
fDate :
10-13 Dec. 2010
Firstpage :
118
Lastpage :
122
Abstract :
This paper studied the mechanisms and models of activation energy(Ea) based on the experiment data from quartz resonator long-term aging and high temperature storage. Furthermore, the product´s life could be forecasted under the thermal and bias accelerated environment. 5.0 mm × 3.2 mm metal sealed quartz resonators were used for case study, it indicated the activation energy of high temperature storage which only effected by thermal acceleration factor is higher than aging one. The activation energy of long-term aging shows cube decay tendency when thermal and bias accelerators both exist, that would dramatically reduce the predicted accuracy of product life. The activation energy of current manufactured 5.0 mm × 3.2 mm metal sealed quartz resonator was confirmed as 0.578 eV by regress verification according to the Arrhenius accelerated theory, 85°C for 7 days accelerated aging can predict and guarantee which is equivalent as continue operation for 0.83 year at 25°C without fail.
Keywords :
ageing; crystal resonators; thermal analysis; Arrhenius accelerated theory; activation energy model; bias accelerators; electron volt energy 0.578 eV; high temperature storage; long-term aging; metal sealed quartz resonators; quartz resonator life evaluation; temperature 25 degC; temperature 85 degC; thermal acceleration factor; time 0.83 year; time 7 day; Acceleration; Aging; Frequency control; Integrated circuits; Metals; Temperature distribution; Activation Energy; Aging; High Temperature Storage; Quartz Resonator;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Piezoelectricity, Acoustic Waves and Device Applications (SPAWDA), 2010 Symposium on
Conference_Location :
Xiamen
Print_ISBN :
978-1-4244-9822-2
Type :
conf
DOI :
10.1109/SPAWDA.2010.5744286
Filename :
5744286
Link To Document :
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