• DocumentCode
    2859565
  • Title

    Session 8 computer aids for IC design and testing [breaker page]

  • Author

    Director, S.

  • Author_Institution
    IBM Res. Ctr., Yorktown Heights, NY
  • Volume
    XVIII
  • fYear
    1975
  • fDate
    12-14 Feb. 1975
  • Firstpage
    77
  • Lastpage
    77
  • Abstract
    Start of the above-titled section of the conference proceedings record.
  • Keywords
    Computer aids for IC design and testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference. Digest of Technical Papers. 1975 IEEE International
  • Conference_Location
    Philadelphia, PA, USA
  • Type

    conf

  • DOI
    10.1109/ISSCC.1975.1155453
  • Filename
    1155453
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2859565