Title :
On removing redundant faults in synchronous sequential circuits
Author :
Lin, Xijiang ; Pomeranz, Irith ; Reddy, Sudhakar M.
Author_Institution :
Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
Abstract :
We describe a time-efficient procedure for removing sequentially redundant faults from synchronous sequential circuits with synchronizing sequences. We use the properties of redundant faults and propose several methods to identify subsets of redundant faults that can be removed simultaneously from the circuit. By removing several redundant faults simultaneously, the number of repetitions of the test generation procedure invoked to identify redundant faults is reduced. Experimental results presented in this work demonstrate the effectiveness of the proposed removal procedure
Keywords :
automatic testing; integrated circuit testing; integrated logic circuits; logic testing; redundancy; sequences; sequential circuits; redundant fault identification; redundant faults removal; synchronizing sequences; synchronous sequential circuits; test generation procedure; time-efficient procedure; Circuit faults; Circuit testing; Cities and towns; Combinational circuits; Electrical fault detection; Fault detection; Fault diagnosis; Logic circuits; Redundancy; Sequential circuits;
Conference_Titel :
VLSI Test Symposium, 1998. Proceedings. 16th IEEE
Conference_Location :
Monterey, CA
Print_ISBN :
0-8186-8436-4
DOI :
10.1109/VTEST.1998.670865
