Title :
Computer aided synthesis of an IC electrical diagram from mask data
Author :
Le Carpentier, J.
Author_Institution :
RTC-La Radiotechnique-Compelec, Caen, France
Abstract :
A method affording computerized checking of IC layouts and comparisons with electrical design before commitment to mask making, will be described. Advantages include reduction of development delays and resultant costs.
Keywords :
Circuit topology; Computer displays; Computer errors; Contacts; Costs; Design automation; Extremities; Integrated circuit layout; Integrated circuit synthesis; Resistors;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1975 IEEE International
DOI :
10.1109/ISSCC.1975.1155459
