Title :
A tolerancing program for practical circuit design
Author_Institution :
Bell Labs., Holmdell, NJ, USA
Abstract :
A computer aid for practical tolerance assignment has been developed. Monte Carlo analysis including active and passive device statistics is coupled to an interpreter algorithm to converge on device tolerances which maximize circuit yield.
Keywords :
Circuit analysis; Circuit optimization; Circuit synthesis; Circuit testing; Circuits and systems; Costs; Feedback circuits; Feedback loop; Monte Carlo methods; Performance analysis;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1975 IEEE International
DOI :
10.1109/ISSCC.1975.1155462
