Title :
Using verification technology for validation coverage analysis and test generation
Author :
Moundanos, Dinos ; Abraham, Jacob A.
Author_Institution :
Comput. Eng. Res. Center, Texas Univ., Austin, TX, USA
Abstract :
Despite great advances in Formal Verification (FV) simulation is still the primary means for design validation. The definition of pragmatic measures for the coverage achieved and the problem of automatic test generation (ATG) are of great importance. In this paper we introduce a new set of metrics, the Event Sequence Coverage Metrics (ESCMs). Our approach is based on an automatic method to extract the control flow of a circuit which can be explored for coverage analysis and ATG. We combine FV and traditional ATPG techniques to automatically generate sequences which traverse uncovered parts of the control graph or exercise uninstantiated control event sequences
Keywords :
automatic testing; circuit CAD; circuit analysis computing; design for testability; microprocessor chips; ATPG; Event Sequence Coverage Metrics; automatic test generation; control event sequences; control flow; control graph; coverage analysis; design validation; formal verification simulation; test generation; uncovered parts; validation coverage analysis; verification technology; Automatic generation control; Automatic test pattern generation; Automatic testing; Circuit simulation; Circuit testing; Computational modeling; Computer simulation; Design engineering; Hardware design languages; Jacobian matrices;
Conference_Titel :
VLSI Test Symposium, 1998. Proceedings. 16th IEEE
Conference_Location :
Monterey, CA
Print_ISBN :
0-8186-8436-4
DOI :
10.1109/VTEST.1998.670877