Title :
Synthesis of circuits with low-cost concurrent error detection based on Bose-Lin codes
Author :
Das, Debaleena ; Touba, Nur A.
Author_Institution :
Comput. Eng. Res. Center, Texas Univ., Austin, TX, USA
Abstract :
This paper presents a procedure for synthesizing multilevel circuits with concurrent error detection based on Bose-Lin codes (1985). Bose-Lin codes are an efficient solution for providing concurrent error detection as they are separable codes and have a fixed number of check bits, independent of the number of information bits. Furthermore, Bose-Lin code checkers have a simple structure as they are based on modulo operations. Procedures are described for synthesizing circuits in a way that their structure ensures that all single-point faults can only cause errors that are detected by a Bose-Lin code. This paper also presents an efficient scheme for concurrent error detection in sequential circuits. Both the state bits and the output bits are encoded with a Bose-Lin code and their checking is combined such that one checker suffices. Results indicate low area overhead. The cost of concurrent error detection is reduced significantly compared to other methods
Keywords :
combinational circuits; error detection codes; fault diagnosis; logic design; multivalued logic circuits; sequential circuits; Bose-Lin code checkers; check bits; error detection codes; low-cost concurrent error detection; modulo operations; multilevel circuit synthesis; self-checking combinational circuits; separable codes; sequential circuits; single-point faults; Circuit faults; Circuit synthesis; Circuit testing; Computer errors; Concurrent computing; Costs; Electrical fault detection; Fault detection; Inverters; Sequential circuits;
Conference_Titel :
VLSI Test Symposium, 1998. Proceedings. 16th IEEE
Conference_Location :
Monterey, CA
Print_ISBN :
0-8186-8436-4
DOI :
10.1109/VTEST.1998.670885