DocumentCode :
2860421
Title :
Author index
fYear :
1998
fDate :
30-30 April 1998
Firstpage :
471
Lastpage :
472
Abstract :
The author index contains an entry for each author and coauthor included in the proceedings record.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 1998. Proceedings. 16th IEEE
Conference_Location :
Monterey, CA, USA
ISSN :
1093-0167
Print_ISBN :
0-8186-8436-4
Type :
conf
DOI :
10.1109/VTEST.1998.670914
Filename :
670914
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2860421
