• DocumentCode
    2860542
  • Title

    Growth and structure analysis of tungsten oxide nanorods using environmental transmission electron microscopy

  • Author

    Tokunaga, Tomoharu ; Kawamoto, Tadashi ; Tanaka, Kenta ; Nakamura, Naohiro ; Sasaki, Katsuhiro ; Kuroda, Kotaro ; Hayashi, Yasuhiko

  • Author_Institution
    Dept. of Quantum Eng., Nagoya Univ., Nagoya, Japan
  • fYear
    2011
  • fDate
    21-24 June 2011
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    The WO3 nanorods were fabricated in environmental transmission electron microscopy (ETEM) by simply heating it in oxygen atmosphere. Altough, WO3 nanorod showed high crystalline, but the stacking fault existed in nanorod. Furthermore, the nanorod was grown on tungsten wire through slit of oxide layer on it.
  • Keywords
    nanofabrication; nanorods; semiconductor growth; semiconductor materials; stacking faults; transmission electron microscopy; tungsten compounds; ETEM; WO3; crystalline; environmental transmission electron microscopy; growth analysis; nanofabrication; nanorod; oxide layer slit; oxygen atmosphere heating; stacking fault; structure analysis; Crystals; Face; Heating; Nanostructures; Tungsten; Wires; in-situ TEM; oxidation; tungsten;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanoelectronics Conference (INEC), 2011 IEEE 4th International
  • Conference_Location
    Tao-Yuan
  • ISSN
    2159-3523
  • Print_ISBN
    978-1-4577-0379-9
  • Electronic_ISBN
    2159-3523
  • Type

    conf

  • DOI
    10.1109/INEC.2011.5991617
  • Filename
    5991617
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2860542