Title :
Dynamic element matching for high-accuracy monolithic D/A converters
Author :
van de Plassche, R.
Author_Institution :
Philips Resesarch Laboratories, Eindhoven, Netherlands
Abstract :
A 12-bit monolithic D/A network with internal reference sources as a test circuit will be described. Circuit requires no trimming and is insensitive to element aging.
Keywords :
Artificial intelligence; Circuit testing; Equations; Filtering; Frequency; Laboratories; Mirrors; Optical device fabrication; Resistors; Switches;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1976 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1976.1155525
