DocumentCode :
2860986
Title :
Simulated growth rates for single-bunch instabilities driven by a resistive impedance
Author :
Towne, N.
Author_Institution :
Nat. Synchrotron Light Source, Brookhaven Nat. Lab., Upton, NY
Volume :
5
fYear :
2003
fDate :
12-16 May 2003
Firstpage :
3168
Lastpage :
3170
Abstract :
Vlasov simulations of instabilities driven by resistive impedance are used to determine growth rates of single-bunch instabilities. A method for measuring synchrotron tunes and growth rates from simulated synchrotron sidebands is described. Simulated growth rates are compared with Oide´s calculation [K. Oide, Part. Accel. 51, 43 (1995)]
Keywords :
particle beam stability; Vlasov simulations; resistive impedance; simulated growth rates; single-bunch instabilities; synchrotron sidebands; synchrotron tunes; Computational modeling; Damping; Frequency; Impedance; Laboratories; Light sources; Microwave theory and techniques; Resonance; Synchrotron radiation; Time domain analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Particle Accelerator Conference, 2003. PAC 2003. Proceedings of the
Conference_Location :
Portland, OR
ISSN :
1063-3928
Print_ISBN :
0-7803-7738-9
Type :
conf
DOI :
10.1109/PAC.2003.1289850
Filename :
1289850
Link To Document :
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