Near-field scanning acoustic microscope

Author

Khuri-Yakub, B.T. ; Cinbis, C. ; Chou, C.H. ; Reinholdtsen, P.A.

Author_Institution

W.W. Hansen Lab. of Phys., Stanford Univ., CA, USA

fYear

1989

fDate

3-6 Oct 1989

Firstpage

805

Abstract

A traditional scanning acoustic microscope (SAM) has been modified to operate in the near-field mode. A pinhole in a thin shim of brass defines the resolution of the instrument, which can be as small as 0.1 λ. In an edge scan experiment, a 125-μm-thick brass shim with a pinhole size of 125 μm, a SAM operating at 3 MHz, and a transducer with an F-number of 0.7 are used. The improvement in resolution corresponds to using a transducer with an F-number of 0.2. The results of measurements of the line response of the system, using steel pinholes of several thicknesses and diameters at different linewidths and operating frequencies and showing the details of the design of the instrument, are presented

Keywords

acoustic microscopes; 125 micron; 3 MHz; F-number; brass shim; design; diameters; edge scan experiment; line response; linewidths; new field scanning acoustic microscope; operating frequencies; pinhole size; steel pinholes; thicknesses; transducer; Anisotropic magnetoresistance; Current measurement; Gratings; Magnetic properties; Microscopy; Phase measurement; Slabs; Steel; Surface impedance; Transducers;

fLanguage

English

Publisher

ieee

Conference_Titel

Ultrasonics Symposium, 1989. Proceedings., IEEE 1989

Conference_Location

Montreal, Que.

Type

conf

DOI

10.1109/ULTSYM.1989.67098

Filename

67098