DocumentCode :
2861777
Title :
Reliability
Author :
Rowe, Wayne
Author_Institution :
Westinghouse Electric Corp., Pittsburgh, PA, USA
Volume :
I
fYear :
1958
fDate :
20-21 Feb. 1958
Firstpage :
37
Lastpage :
37
Abstract :
Presents an abstract of the conference paper.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1958 IEEE International
Conference_Location :
Philadelphia, PA, USA
Type :
conf
DOI :
10.1109/ISSCC.1958.1155589
Filename :
1155589
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2861777
