• DocumentCode
    2861901
  • Title

    Characterization of patterned quasi-1D ZnO nanowire arrays

  • Author

    Kuo, Shou-Yi ; Lai, Fang-I ; Chen, Wei-Chun ; Lin, Woei-Tyng ; Hsieh, Ming-Yang

  • Author_Institution
    Dept. of Electron. Eng., Chang Gung Univ., Kwei-Shan, Taiwan
  • fYear
    2011
  • fDate
    21-24 June 2011
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Hexagonally patterned quasi-one-dimensional (quasi-1D) ZnO nanowire arrays have been successfully synthesized through a simple vapor transport process without metal catalysts. With the aid of a polystyrene microsphere self-assembled monolayer, sol-gel-derived ZnO thin film was used as the periodic nucleation sites for nanowire growth. High-quality quasi-1D ZnO nanowires were demonstrated via structural and optical measurements. A vapor transport solid condensation mechanism was proposed, in which the role of ZnO thin film was to provide nucleation sites for nanowire growth. This method provides a promising way to create quasi-1D ZnO nanostructures for applications such as two-dimensional photonic crystal, nanolaser arrays, sensor arrays, and optoelectronic devices.
  • Keywords
    II-VI semiconductors; nanowires; optoelectronic devices; photonic crystals; self-assembly; semiconductor quantum wires; semiconductor thin films; sensor arrays; sol-gel processing; wide band gap semiconductors; zinc compounds; ZnO; ZnO nanowire arrays; ZnO thin film; hexagonally patterned quasi1D nanowire arrays; nanolaser arrays; nanowire growth; optical measurements; optoelectronic devices; periodic nucleation; polystyrene microsphere; self-assembled monolayer; sensor arrays; simple vapor transport process; sol-gel; structural measurements; two-dimensional photonic crystal; vapor transport solid condensation; Annealing; Buffer layers; Electron tubes; Nanostructures; Substrates; X-ray scattering; Zinc oxide; ZnO; nanowire; quasi-one-dimensional;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanoelectronics Conference (INEC), 2011 IEEE 4th International
  • Conference_Location
    Tao-Yuan
  • ISSN
    2159-3523
  • Print_ISBN
    978-1-4577-0379-9
  • Electronic_ISBN
    2159-3523
  • Type

    conf

  • DOI
    10.1109/INEC.2011.5991700
  • Filename
    5991700