• DocumentCode
    2861915
  • Title

    Zero-background tunable diode laser absorption spectroscopies using balanced interferometers

  • Author

    Guan, Zuguang ; Lewander, Märta ; Svanberg, Sune

  • Author_Institution
    Atomic Phys. Div., Lund Univ., Lund, Sweden
  • fYear
    2009
  • fDate
    14-19 June 2009
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Tunable diode laser spectroscopy (TDLS) is one of the most successful techniques for trace-gas environmental monitoring. By modulating the light source at high frequency for suppressing the noise, frequency modulation or wavelength modulation TDLS can measure optical absorption in atomic or molecular samples with high resolution and sensitivity. Apart from these absorptive techniques, there exists a group of zero-background spectroscopic methods, e.g. laser-induced fluorescence spectroscopy, photo-acoustic spectroscopy, and polarization spectroscopy. Here a spectroscopic signal rises from a zero or low background with little noise and these methods therefore can achieve good signal-to-noise ratio (SNR) even without any modulation on the light source.
  • Keywords
    light absorption; light interferometers; optical modulation; optical tuning; semiconductor lasers; visible spectroscopy; absorptive techniques; atomic sample; balanced interferometers; frequency modulation; light source modulation; molecular sample; noise suppression; optical absorption; spectroscopic signal; trace-gas environmental monitoring; tunable diode laser spectroscopy; wavelength modulation; zero-background spectroscopic methods; zero-background tunable diode laser absorption spectroscopies; Absorption; Atomic measurements; Diode lasers; Interferometers; Light sources; Optical modulation; Optical noise; Signal to noise ratio; Spectroscopy; Tunable circuits and devices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics 2009 and the European Quantum Electronics Conference. CLEO Europe - EQEC 2009. European Conference on
  • Conference_Location
    Munich
  • Print_ISBN
    978-1-4244-4079-5
  • Electronic_ISBN
    978-1-4244-4080-1
  • Type

    conf

  • DOI
    10.1109/CLEOE-EQEC.2009.5196290
  • Filename
    5196290